The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 06, 2018

Filed:

Jun. 09, 2015
Applicant:

Arizona Board of Regents on Behalf of Arizona State University, Scottsdale, AZ (US);

Inventors:

Junseok Chae, Scottsdale, AZ (US);

Jennie Appel, Tempe, AZ (US);

Joseph Liao, Stanford, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/50 (2006.01); G01N 21/84 (2006.01); G01N 33/487 (2006.01); G01N 33/574 (2006.01);
U.S. Cl.
CPC ...
G01N 33/5091 (2013.01); G01N 21/8422 (2013.01); G01N 33/487 (2013.01); G01N 33/574 (2013.01);
Abstract

Systems and methods for performing cancer screening assays are disclosed. The disclosed systems and methods use a thin film comprising cross-linked polysiloxane. At least a portion of a biological sample to be assayed is contacted with the thin film, along with a cell culture media. After a subsequent incubation period, the thin film is visualized to detect a wrinkle pattern (or lack thereof). The presence of one or more wrinkles and/or a higher degree of wrinkling in the thin film indicates the presence of cancer cells in the biological sample. The disclosed systems and methods can be incorporated into improved assays and kits for cancer screening.


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