The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 06, 2018
Filed:
Feb. 12, 2016
Fbs, Inc., Bellefonte, PA (US);
Steven E. Owens, Bellefonte, PA (US);
Cody J. Borigo, Pennsylvania Furnace, PA (US);
Joseph L. Rose, State College, PA (US);
Borja Lopez, Lynchburg, VA (US);
FBS, Inc., Bellefonte, PA (US);
Abstract
An inspection system includes a magnetostrictive scanner probe, a ferromagnetic strip, at least one magnet, and a processor. The magnetostrictive scanner probe includes a probe body for supporting at least one flexible sensor coil and a position encoder. The ferromagnetic strip is configured to be coupled to a structure, and the at least one magnet is configured to apply a biasing magnetization to the ferromagnetic strip. The processor is configured to cause a time-varying current to be generated in the at least one flexible sensor coil to induce a time-varying magnetization in said ferromagnetic strip perpendicular to said biasing magnetization to generate shear horizontal-type guided wave energy into said structure, and process reflected shear horizontal-type guided wave energy received by the at least one flexible sensor coil as the probe is moved relative to said structure to generate at least one two-dimensional image of a region of said structure.