The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 06, 2018
Filed:
Dec. 02, 2013
Shimadzu Corporation, Kyoto-shi, Kyoto, JP;
Akira Aono, Kyoto, JP;
SHIMADZU CORPORATION, Kyoto-shi, Kyoto, JP;
Abstract
A heat retention start timing of each sample container is determined based on a room temperature detected by a room temperature sensor, and a starting temperature and an ending temperature of each sample at a time of programmed temperature analysis that are stored in an analysis condition storage section. Since cooling speed of each sample container varies depending on the room temperature, the cooling time (A, B, C, . . . ) of each sample container may be predicted based on the ending temperature of each sample at the time of programmed temperature analysis, the starting temperature of a next sample at the time of the programmed temperature analysis, and the room temperature. By determining the heat retention start timing of each sample container according to the cooling time (A, B, C, . . . ) of each sample container predicted in the above manner, a margin time (A, B, C, . . . ) after the cooling time may be prevented from becoming unnecessarily long. Accordingly, the processing performance may be improved compared to a conventional configuration where the heat retention start timings of sample containers are shifted by fixed time intervals.