The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 06, 2018

Filed:

Mar. 31, 2016
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Xue Rui, Clifton Park, NY (US);

Geng Fu, Clifton Park, NY (US);

Jianjun Guo, Ballston Spa, NY (US);

Bruno Kristiaan Bernard De Man, Clifton Park, NY (US);

Brian David Yanoff, Schenectady, NY (US);

Assignee:

GENERAL ELECTRIC COMPANY, Schenectady, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/046 (2018.01); G01T 1/17 (2006.01); G01T 1/29 (2006.01); G01N 23/083 (2018.01);
U.S. Cl.
CPC ...
G01N 23/046 (2013.01); G01N 23/083 (2013.01); G01T 1/17 (2013.01); G01T 1/2985 (2013.01); G01N 2223/505 (2013.01);
Abstract

The present approach relates to a detector design that allows detector-based wobble using an electronic control scheme. In one implementation, each detector pixel is divided into sub-pixels. The readout of the sub-pixels can be binned with minimal noise penalty to enable the detector wobble without physically shifting the detector or alternating the physical focal spot location, though, as discussed herein alternation of the focal spot location may be used in conjunction with the present approach to further improve radial and longitudinal imaging resolution as well as suppressing artifacts resulted by limited spatial sampling.


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