The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 06, 2018

Filed:

Jul. 19, 2017
Applicants:

Jun Zhao, The Woodlands, TX (US);

Xin Jack Zhou, Hockessin, DE (US);

Sean Xiaolu Wang, Wilmington, DE (US);

Inventors:

Jun Zhao, The Woodlands, TX (US);

Xin Jack Zhou, Hockessin, DE (US);

Sean Xiaolu Wang, Wilmington, DE (US);

Assignee:

B & W Tek LLC, Newark, DE (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/65 (2006.01); G01N 33/15 (2006.01); G01J 3/10 (2006.01); G01J 3/02 (2006.01);
U.S. Cl.
CPC ...
G01N 21/658 (2013.01); G01J 3/021 (2013.01); G01J 3/0229 (2013.01); G01J 3/10 (2013.01); G01N 33/15 (2013.01); G01J 2003/102 (2013.01);
Abstract

This invention relates to an apparatus and method for performing bidirectional Raman spectroscopy of a sample, preferably a diffusely scattering sample, in which two excitation light sources are employed to illuminate the sample from two opposite directions to excite Raman scattering signal from the sample. The Raman scattering signal which transmits through the sample are collected by two optical devices each positioned on the opposite side of the sample to obtain two transmission Raman spectra of the sample, which enables the accurate determination of the composition of the whole sample.


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