The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 06, 2018

Filed:

Dec. 14, 2016
Applicant:

B&w Tek Llc, Newark, DE (US);

Inventors:

Jun Zhao, The Woodlands, TX (US);

Xin Jack Zhou, Hockessin, DE (US);

Sean Xiaolu Wang, Wilmington, DE (US);

Assignee:

B&W TEK LLC, Newark, DE (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/65 (2006.01); G01J 3/02 (2006.01); G01J 3/44 (2006.01);
U.S. Cl.
CPC ...
G01N 21/65 (2013.01); G01J 3/0216 (2013.01); G01J 3/44 (2013.01); G01N 2021/651 (2013.01); G01N 2201/068 (2013.01); G01N 2201/0636 (2013.01); G01N 2201/08 (2013.01);
Abstract

This invention relates to a light delivery and collection device for measuring Raman scattering from a large area of a sample. The light delivery and collection device comprises a reflective cavity made of a material or having a surface coating with high reflectivity to the excitation light and the Raman scattered light. The reflective cavity has two apertures. The first aperture is configured to receive the excitation light which then projects onto the second aperture. The second aperture is configured to be applied close to the sample such that the reflective cavity substantially forms an enclosure covering a large area of the sample. The excitation light produces Raman scattered light from the covered area of the sample. The reflective cavity reflects any excitation light and Raman light scattered from the sample unless the excitation light and the Raman scattered light either emit from the first aperture to be measured with a spectrometer device, or are re-scattered by the sample at the second aperture. The multi-reflection of the reflective cavity greatly improves the excitation efficiency of Raman scattering from the sample and in the meantime enhances its collection efficiency. In addition, it also causes more excitation light to penetrate into a diffusely scattering sample and allows efficient collection of the Raman scattered light generated thereof, hence enabling sub-surface Raman scattering measurement.


Find Patent Forward Citations

Loading…