The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 06, 2018
Filed:
Oct. 09, 2015
Malvern Instruments Limited, Worcestershire, GB;
Jason Cecil William Corbett, Worcestershire, GB;
MALVERN PANALYTICAL LIMITED, Malvern, Worcestershire, unknown;
Abstract
An instrument and a method for measuring the characteristics of particles in a sample. The instrument comprises a light source operable to provide a light beam and defining an illumination axis; a sample cell placed on the illumination axis; a scattered light detector positioned to receive scattered light along a detection path from a sample in the sample cell, the scattered light produced by the interaction of the light beam with the sample; and a filter changer positioned between the sample cell and the scattered light detector. The filter changer comprises at least one optical filter and an actuator. The actuator is operable to move each of the at least one optical filter between a first position in which the detection path does not pass through the optical filter, and a second position in which the detection path passes through the optical filter.