The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 06, 2018

Filed:

Jul. 28, 2015
Applicant:

Micronas Gmbh, Freiburg, DE;

Inventors:

Yan Bondar, Waldkirch, DE;

Stefan Albrecht, Gundelfingen, DE;

Assignee:

TDK-Micronas GmbH, Freiburg, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D 5/245 (2006.01); G01D 5/14 (2006.01);
U.S. Cl.
CPC ...
G01D 5/2451 (2013.01); G01D 5/147 (2013.01);
Abstract

A measuring system and drive system with a measuring system, a magnet, a transmitter, and a magnetic field sensor. The magnetic field sensor is arranged between the magnet and the transmitter. The transmitter has a number of segments made of a magnetically conductive material, each segment having a wing shape with a web edge that is radially directed outwards, each web edge being diagonally designed towards the rotational direction, and that each web edge is distanced from the magnetic field sensor by an air gap.


Find Patent Forward Citations

Bondar, Yan. (2018). Measuring system and drive system (U.S. Patent No. 10119840). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10119840

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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