The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 06, 2018
Filed:
Jan. 27, 2016
Guangdong University of Technology, Guangzhou, CN;
Jisheng Pan, Guangzhou, CN;
Qiusheng Yan, Guangzhou, CN;
Weiqiang Gao, Guangzhou, CN;
Peng Yu, Guangzhou, CN;
GUANGDONG UNIVERSITY OF TECHNOLOGY, Guangzhou, CN;
Abstract
Provided is a self-sharpening polishing device with magnetorheological flexible polishing pad formed by dynamic magnetic field and polishing method thereof. The device includes a polishing disc revolution mechanism and a multi-magnetic-pole synchronous rotary drive mechanism, the polishing disc revolution mechanism including a transmission shaft motor, a transmission shaft, a transfer disc, an eccentric shaft fixing disc, a cup-shaped polishing disc and a transmission shaft transmission mechanism, the multi-magnetic-pole synchronous rotary drive mechanism including an eccentric spindle, a synchronous rotary drive disc, flexible eccentric rotating shafts, eccentric sleeves, magnetic poles, the eccentric shaft fixing disc, and a spindle motor, etc. The device does not need a circulating device to renew magnetorheological fluid and does not need to renew the magnetorheological fluid during the finishing process; in fact the entire process from rough polishing to precise polishing can be done at one time. The device maintains a consistent workpiece surface and delivers a low cost and very efficient polishing process that is eminently suitable for the planes of optical elements with large diameter; it is also suitable for studying the material removal mechanism of planar optical materials and detecting sub-surface damage, as well as other experimental studies.