The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 06, 2018

Filed:

Sep. 15, 2017
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Russell Budd, North Salem, NY (US);

Robert Polastre, Cold Spring, NY (US);

Paul Andry, Yorktown Heights, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/00 (2006.01); H01L 21/02 (2006.01); H01L 23/544 (2006.01); B23K 26/402 (2014.01); B23K 26/04 (2014.01); H01L 21/683 (2006.01); H01L 21/67 (2006.01); G01B 11/26 (2006.01); B32B 7/12 (2006.01);
U.S. Cl.
CPC ...
B23K 26/043 (2013.01); B23K 26/402 (2013.01); G01B 11/26 (2013.01); H01L 21/02002 (2013.01); H01L 21/67092 (2013.01); H01L 21/6835 (2013.01); B32B 7/12 (2013.01);
Abstract

A method and system for aligning a scan laser beam on a wafer include scanning a scan laser beam across a laser beam sensor along a scan line, picking up a scan laser beam, at a first position, using a first optical slit of the laser beam sensor to generate a first electrical pulse, picking up the scan laser beam, at a second position, using a second optical slit of the laser beam sensor to generate a second electrical pulse, picking up the scan laser beam, at a third position, using a third optical slit of the laser beam sensor to generate a third electrical pulse, and determining a spot size and a position of the laser beam based on the first to third electrical pulses.


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