The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 06, 2018

Filed:

Oct. 30, 2017
Applicant:

Kabushiki Kaisha Toshiba, Minato-ku, JP;

Inventors:

Koki Yanagawa, Tokorozawa, JP;

Shinya Fukushima, Fuchu, JP;

Kazunao Maeda, Nakano, JP;

Keiko Okaya, Setagaya, JP;

Assignee:

KABUSHIKI KAISHA TOSHIBA, Minato-ku, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/246 (2017.01); A61N 5/10 (2006.01);
U.S. Cl.
CPC ...
A61N 5/1049 (2013.01); A61N 5/1067 (2013.01); G06T 7/248 (2017.01); H05K 999/99 (2013.01); A61N 2005/1061 (2013.01); G06T 2207/10081 (2013.01); G06T 2207/30061 (2013.01);
Abstract

A movable part tracking and treatment apparatus includes an acquisition unit adapted to acquire a three-dimensional moving image and a first projection image generation unit adapted to generate a first projection moving image. The apparatus further includes an affected part image extraction unit adapted to extract the displaced affected part area from the first projection moving image and a tracing target image extraction unit adapted to extract the displaced tracing target from the first projection moving image. The apparatus also includes a first parameter derivation unit adapted to derive a first parameter indicative of position information on a beam irradiation point and a second parameter derivation unit adapted to derive a second parameter necessary to extract the corresponding tracing target.


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