The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 30, 2018
Filed:
Nov. 20, 2014
Boe Technology Group Co., Ltd., Beijing, CN;
Hefei Boe Optoelectronics Technology Co., Ltd., Hefei, Anhui, CN;
Yan Jiang, Beijing, CN;
Liwen Cai, Beijing, CN;
Xiaowei Gong, Beijing, CN;
Dan Li, Beijing, CN;
Peng Sui, Beijing, CN;
BOE TECHNOLOGY GROUP CO., LTD., Beijing, CN;
HEFEI BOE OPTOELECTRONICS TECHNOLOGY CO., LTD., Hefei, Anhui, CN;
Abstract
Embodiments of the present invention provide a manufacturing jig and a manufacturing apparatus for a temperature measuring sample. The manufacturing jig for a temperature measuring sample includes a first clamping mechanism configured to clamp the strip thermometer and adjust position of the strip thermometer, so that the best temperature measuring point at an end of the strip thermometer is at width center point of the coupling end of the printed circuit board. With the first clamping mechanism, the best temperature measuring point can be located at the width center point of the coupling end, so that alignment deviation of the best temperature measuring point in the width direction of the coupling end due to manual alignment is greatly reduced, which further ensures temperature measuring result of the temperature measuring sample are more accurate, and accurate control on actual pressing temperature of the pressing device can be achieved.