The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 30, 2018

Filed:

Aug. 06, 2010
Applicants:

Baojuan Guo, Beijing, CN;

Dajun Zhang, Beijing, CN;

Inventors:

Baojuan Guo, Beijing, CN;

Dajun Zhang, Beijing, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04W 72/12 (2009.01); H04B 7/26 (2006.01);
U.S. Cl.
CPC ...
H04W 72/1231 (2013.01); H04B 7/2643 (2013.01);
Abstract

A method, a system and a device for reporting uplink pilot interference are provided, which are applied to time division duplex (TDD) system, and include: a base station measures uplink pilot time slot (UpPTS) interferences within respective cell portions; the base station transmits the uplink pilot time slot interferences, which carries the home cell portion IDs corresponding to the uplink pilot time slot interferences, to a radio network controller, and the radio network controller selects the transmitting position of the uplink pilot time slot for all cell portions according to the uplink pilot time slot interferences and the home cell portion IDs. The system realizes the reporting of the dedicated measurement in TDD system.


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