The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 30, 2018

Filed:

Sep. 19, 2017
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Sharad Shahi, Boulder, CO (US);

Bhaskara Viswanadham Batchu, Ameenpur Village, IN;

Soumen Mitra, Hyderabad, IN;

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 36/00 (2009.01); H04W 48/12 (2009.01); H04W 36/30 (2009.01); H04W 48/16 (2009.01); H04W 72/08 (2009.01); H04W 48/20 (2009.01); H04W 16/14 (2009.01); H04B 7/08 (2006.01); H04W 74/00 (2009.01);
U.S. Cl.
CPC ...
H04W 36/0061 (2013.01); H04W 36/30 (2013.01); H04W 48/12 (2013.01); H04W 48/16 (2013.01); H04W 48/20 (2013.01); H04W 72/085 (2013.01); H04B 7/0868 (2013.01); H04W 16/14 (2013.01); H04W 74/006 (2013.01);
Abstract

Certain aspects of the present disclosure generally relate to wireless communication. In some aspects, a base station may generate a second neighbor cell list based at least in part on information that identifies a location of a user equipment (UE) and a neighbor cell measurement report associated with a first neighbor cell list configured on the UE; determine a length of a measurement gap for a measurement, to be performed by the UE, based at least in part on the second neighbor cell list, wherein the length of the measurement gap is determined based at least in part on a serving cell measurement report associated with the UE; and provide, to the UE, the second neighbor cell list and information that identifies the length of the measurement gap. Numerous other aspects are provided.


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