The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 30, 2018

Filed:

Jul. 31, 2017
Applicant:

Opswat, Inc., San Francisco, CA (US);

Inventors:

Benjamin Czarny, San Francisco, CA (US);

Jianpeng Mo, Burlingame, CA (US);

Ali Rezafard, Millbrae, CA (US);

David Matthew Patt, Kansas City, MO (US);

Assignee:

OPSWAT, INC., San Francisco, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 29/06 (2006.01); G06F 17/30 (2006.01); G06F 21/57 (2013.01);
U.S. Cl.
CPC ...
H04L 63/1433 (2013.01); G06F 17/30289 (2013.01); G06F 21/577 (2013.01); H04L 63/1425 (2013.01); H05K 999/99 (2013.01);
Abstract

Computer security vulnerability assessment is performed with product binary data and product vulnerability data that correspond with product identification data. A correspondence between the product binary data and the product vulnerability data is determined, and a binaries-to-vulnerabilities database is generated. The binaries-to-vulnerabilities database is used to scan binary data from a target device to find matches with the product binary data. A known security vulnerability of the target device is determined based on the scanning and the correspondence between the product binary data and the vulnerability data. In some embodiments, the target device is powered off and used as an external storage device to receive the binary data therefrom.


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