The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 30, 2018

Filed:

Dec. 24, 2014
Applicants:

Institut Mines-telecom, Paris, FR;

Massachusetts Institute of Technology, Cambridge, MA (US);

Inventors:

Venkat Chandar, New York, NY (US);

Aslan Tchamkerten, Verrieres le Buisson, FR;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 27/06 (2006.01); H04L 7/04 (2006.01); H04L 12/26 (2006.01); H04B 1/7075 (2011.01); G06F 17/15 (2006.01);
U.S. Cl.
CPC ...
H04L 7/042 (2013.01); G06F 17/15 (2013.01); H04B 1/70752 (2013.01); H04L 43/024 (2013.01);
Abstract

A method of detecting transient changes in the distribution of a discrete time series includes: operating in a sparse mode wherein, at sniff periods successively repeated at a first rate, at most K test phases are performed, K being an integer superior or equal to two, each test phase consisting of analyzing, by a sampling stopping time determination unit, samples of the time series captured by a sampler at sampling times according to a second rate which is higher than the first rate to provide a positive or negative result of the test phase. If the results of K successive test phases of a sniff period are each positive, the method switches to operate in a dense mode wherein the sampler is operated to continuously capture samples of the time series at sampling times according to the second sampling rate.


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