The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 30, 2018

Filed:

Jan. 20, 2017
Applicant:

Huawei Technologies Co., Ltd., Shenzhen, CN;

Inventors:

Yuchun Lu, Beijing, CN;

Liang Li, Beijing, CN;

Suping Zhai, Beijing, CN;

Dajun Zang, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/00 (2006.01); H04L 1/00 (2006.01); H03M 13/37 (2006.01); H03M 13/33 (2006.01); H04L 7/04 (2006.01);
U.S. Cl.
CPC ...
H04L 1/0083 (2013.01); H03M 13/333 (2013.01); H03M 13/3746 (2013.01); H04L 1/00 (2013.01); H04L 7/048 (2013.01); H05K 999/99 (2013.01);
Abstract

The present embodiments provide a method and an apparatus for determining a frame boundary of an FEC frame, and a decoding system. The method includes receiving data, where the data includes N+P consecutive symbols, N consecutive symbols constitute a first data block, and N consecutive symbols constitute a second data block; obtaining s parameter values corresponding to the first data block. The method also includes determining a first iterative item and a second iterative item and determining, according to the s parameter values corresponding to the first data block, s parameter values corresponding to the second data block. Additionally, the method includes determining, according to the s parameter values corresponding to the second data block, whether the second symbol is a frame boundary of an FEC frame.


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