The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 30, 2018

Filed:

Mar. 17, 2017
Applicant:

Aireon Llc, McLean, VA (US);

Inventors:

Michael A. Garcia, Ashburn, VA (US);

Boris Veytsman, McLean, VA (US);

Assignee:

Aireon LLC, McLean, VA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 7/185 (2006.01); G08G 5/00 (2006.01);
U.S. Cl.
CPC ...
H04B 7/18513 (2013.01); G08G 5/0008 (2013.01); H04B 7/18508 (2013.01); H04B 7/18582 (2013.01);
Abstract

In one implementation, a method for scheduling beams of an antenna on a satellite during a defined time period includes calculating a beam score for each beam based on the expected gain of the beam and determining that the number of beams having non-zero beam scores during the defined time period is less than a threshold value. In addition, the method also includes accessing a set of beam weights for each of multiple different candidate beam patterns, and, for each set of weights, multiplying individual beam weights by corresponding beam scores, and generating a candidate beam pattern score by calculating a sum of the products of the beam weights and corresponding beam scores. The method further includes comparing the candidate beam pattern scores, selecting a particular one of the candidate beam patterns, and scheduling the selected beam pattern for the defined time period.


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