The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 30, 2018
Filed:
Jan. 19, 2016
Applicant:
Semiconductor Components Industries, Llc, Phoenix, AZ (US);
Inventors:
Eui-Soo Kim, New Taipei, TW;
Ju-Hyun Kim, Kyounggi-Do, KR;
Yung-I Chang, Taipei, TW;
Jian-Ming Fu, Taichung, TW;
Zhi-Bo Tao, Palo Alto, CA (US);
Jung-Sheng Chen, Kaohsiung, TW;
Young-Bae Park, Taipei, TW;
David Jay Kunst, San Jose, CA (US);
Assignee:
SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC, Phoenix, AZ (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 27/08 (2006.01); H04B 3/46 (2015.01);
U.S. Cl.
CPC ...
H04B 3/46 (2013.01);
Abstract
A pollution detection circuit and a pollution detection method for data lines are provided. The pollution detection circuit and the method detect an impedance of at least one data terminal for detecting the pollution occurring at the data terminal or the data lines. The pollution occurring at the data terminal or the data lines is confirmed when the impedance is low.