The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 30, 2018

Filed:

Dec. 28, 2017
Applicant:

Konica Minolta, Inc., Chiyoda-ku, Tokyo, JP;

Inventors:

Kou Osawa, Hino, JP;

Koujirou Sekine, Ibaraki, JP;

Mitsuru Yokoyama, Takatsuki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 51/56 (2006.01); G06F 17/50 (2006.01); H01L 33/44 (2010.01); H01L 33/58 (2010.01); H01L 51/00 (2006.01); H01L 51/52 (2006.01);
U.S. Cl.
CPC ...
H01L 51/56 (2013.01); G06F 17/5081 (2013.01); H01L 33/44 (2013.01); H01L 33/58 (2013.01); H01L 51/0031 (2013.01); H01L 51/5265 (2013.01); H01L 51/5268 (2013.01); H01L 51/5275 (2013.01); G06F 2217/12 (2013.01); H01L 51/5215 (2013.01); H01L 2251/5315 (2013.01); H01L 2251/5323 (2013.01); H01L 2251/558 (2013.01); H01L 2251/56 (2013.01); H01L 2933/0025 (2013.01); H01L 2933/0058 (2013.01); H01L 2933/0091 (2013.01);
Abstract

A method of designing an electroluminescent device includes preparing a reference device including a construction of an electroluminescent device and a desired analyzed device including a construction of an electroluminescent device, performing quantum optical analysis, electromagnetic field analysis, and ray trace with thicknesses and complex relative permittivities of a first transparent member, a first electrode, a first functional layer, a second functional layer, an emissive layer, and a second electrode as well as a position of a light-emitting point in the emissive layer and a distribution of light-emitting points in the emissive layer being used as design variables, calculating a 'ratio of light extraction efficiency' between the reference device and the analyzed device by computing efficiency of light extraction from the emissive layer into the transparent member or air in both of the reference device and the analyzed device, finding relation of the thickness and the complex relative permittivity of each layer forming the reference device and the analyzed device with the 'ratio of light extraction efficiency,' and obtaining thicknesses and complex relative permittivities of the first transparent member, the first electrode, the first functional layer, the second functional layer, the emissive layer, and the second electrode as the design variables, based on the relation and an electroluminescence spectrum in air and the first transparent member measured by feeding a current to the reference device.


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