The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 30, 2018

Filed:

Sep. 10, 2013
Applicant:

Hitachi Metals, Ltd., Tokyo, JP;

Inventors:

Motoki Ohta, Mishima-gun, JP;

Yoshihito Yoshizawa, Mishima-gun, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01F 1/153 (2006.01); C21D 6/00 (2006.01); C22C 45/02 (2006.01); B22D 11/06 (2006.01); C22C 33/00 (2006.01); C22C 38/00 (2006.01); C22C 38/02 (2006.01); C22C 38/16 (2006.01); C22C 38/06 (2006.01);
U.S. Cl.
CPC ...
H01F 1/15391 (2013.01); B22D 11/0611 (2013.01); C21D 6/00 (2013.01); C22C 33/003 (2013.01); C22C 38/002 (2013.01); C22C 38/02 (2013.01); C22C 38/06 (2013.01); C22C 38/16 (2013.01); C22C 45/02 (2013.01); H01F 1/15333 (2013.01); C21D 2201/03 (2013.01);
Abstract

An ultrafine-crystalline alloy ribbon having a composition represented by the general formula of FeABX, wherein A is Cu and/or Au, X is at least one element selected from the group consisting of Si, S, C, P, Al, Ge, Ga and Be, and x, y and z are numbers meeting the conditions of 0<x≤5, 8≤y≤22, 0≤z≤10, and x+y+z≤25 by atomic %, and a structure in which ultrafine crystal grains having an average particle size of 30 nm or less being dispersed in a proportion of more than 0% and less than 30% by volume in an amorphous matrix; an ultrafine crystal grains-depleted region comprising ultrafine crystal grains at a number density of less than 500/μmbeing formed in a region of 0.2 mm in width from each side of the ribbon.


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