The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 30, 2018
Filed:
Jun. 08, 2017
Siemens Healthcare Gmbh, Erlangen, DE;
Daniel Fischer, Heroldsberg, DE;
Anna Jerebko, Hausen, DE;
Siemens Healthcare GmbH, Erlangen, DE;
Abstract
A method for planning an examination of an examination object by a tomosynthesis machine includes: Raw data of the examination object are acquired from defined acquisition angles. An auxiliary data set is reconstructed from the raw data. Depth data are calculated based on the auxiliary data set calculating a number of projections from the perspective of a respectively defined projection center from the auxiliary data set or from the raw data. Each of the projections has a number of image points each linked with associated depth data. The projections are displayed and at least one projection is chosen. A position of an examination region of the examination object is marked therein. A real three-dimensional position of the examination region is calculated using the marked position and its depth data, and an examination path to the examination region is calculated.