The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 30, 2018

Filed:

Jul. 03, 2017
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Lakshmi Neeharika Gamini, Bangalore, IN;

Sanku Mukherjee, Bangalore, IN;

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/50 (2006.01); G11C 29/38 (2006.01); G11C 29/12 (2006.01); G11C 11/4076 (2006.01); G11C 11/409 (2006.01);
U.S. Cl.
CPC ...
G11C 29/50012 (2013.01); G11C 11/409 (2013.01); G11C 11/4076 (2013.01); G11C 29/12015 (2013.01); G11C 29/38 (2013.01);
Abstract

In calibrating the phase skew between an SDRAM data strobe ('DQS') signal and data ('DQ') signal in a device, the data signal driver circuit impedance is adjusted to impair impedance matching on the DQ signal channel while system-level memory tests are performed. The phase skew is stepped through a range during the memory tests, and an error count is determined for each test. The memory tests may emulate mission-mode operation of the device. Following the memory tests, an optimal phase skew corresponding to a lowest error count is determined. The DQS signal may be delayed with respect to the DQ signals by a value corresponding to the optimal phase skew in subsequent mission-mode operation of the device.


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