The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 30, 2018
Filed:
Nov. 18, 2016
Huawei Technologies Co., Ltd., Shenzhen, CN;
Wanli Ouyang, Hong Kong, HK;
Xiao Chu, Hong Kong, HK;
Wenqi Ju, Shenzhen, CN;
Jianzhuang Liu, Shenzhen, CN;
Xiaogang Wang, Hong Kong, HK;
HUAWEI TECHNOLOGIES CO., LTD., Shenzhen, CN;
Abstract
An image characteristic estimation method and device is presented, where content of the method includes extracting at least two eigenvalues of input image data, and executing the following operations for each extracted eigenvalue, until execution for the extracted eigenvalues is completed. Selecting an eigenvalue, and performing at least two matrix transformations on the eigenvalue using a pre-obtained matrix parameter in order to obtain a first matrix vector corresponding to the eigenvalue; when a first matrix vector corresponding to each extracted eigenvalue is obtained, obtaining second matrix vectors with respect to the at least two extracted eigenvalues using a convolutional network calculation method according to the obtained first matrix vector corresponding to each eigenvalue; and obtaining a status of an image characteristic in the image data by means of estimation according to the second matrix vectors. In this way, accuracy of estimation is effectively improved.