The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 30, 2018
Filed:
Jan. 29, 2016
Raytheon Company, Waltham, MA (US);
Darrell L. Young, Falls Church, VA (US);
Charlotte DeKeyrel, Leesburg, VA (US);
RAYTHEON COMPANY, Waltham, MA (US);
Abstract
Methods and apparatus are provided for identifying optimal threshold values to generate optimal binary images from a digital image. In one example, a method includes, for each of a plurality of candidate threshold values, processing an image using the candidate threshold value to create a first segmented image of a first plurality of blobs; for each of the plurality of candidate threshold values, calculating a threshold value evaluation metric as a count of qualifying blobs in the first plurality of blobs in the first segmented image, wherein the qualifying blobs have a fill factor exceeding a predefined fill factor and have an area within a predefined area range; identifying an optimal threshold value from the plurality of candidate threshold values for which the threshold value evaluation metric is maximized; and processing the image using the optimal threshold value to create a second segmented image of a second plurality of blobs.