The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 30, 2018
Filed:
Jul. 21, 2016
Graduate School AT Shenzhen, Tsinghua University, Shenzhen, Guangdong, CN;
Lei Zhang, Guangdong, CN;
Xiangyang Ji, Guangdong, CN;
Yangguang Li, Guangdong, CN;
Yongbing Zhang, Guangdong, CN;
Xin Jin, Guangdong, CN;
Haoqian Wang, Guangdong, CN;
Guijin Wang, Guangdong, CN;
GRADUATE SCHOOL AT SHENZHEN, TSINGHUA UNIVERSITY, Shenzhen, Guangdong, CN;
Abstract
The present invention discloses a depth map super-resolution processing method, including: firstly, respectively acquiring a first original image (S) and a second original image (S) and a low resolution depth map (d) of the first original image (S); secondly, 1) dividing the low resolution depth map (d) into multiple depth image blocks; 2) respectively performing the following processing on the depth image blocks obtained in step);) performing super-resolution processing on a current block with multiple super-resolution processing methods, to obtain multiple high resolution depth image blocks;) obtaining new synthesized image blocks by using an image synthesis technology;) upon matching and judgment, determining an ultimate high resolution depth image block; and 3) integrating the high resolution depth image blocks of the depth image blocks into one image according to positions of the depth image blocks in the low resolution depth map (d). Through the depth map super-resolution processing method of the present invention, depth information of the obtained high resolution depth maps is more accurate.