The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 30, 2018

Filed:

Aug. 22, 2016
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Colin Whitby-Strevens, Ben Lomond, CA (US);

Kevin M. Keeler, Goleta, CA (US);

Christophe B. Daniel, Belmont, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/00 (2006.01); G06F 13/38 (2006.01); G06F 13/42 (2006.01); G06F 11/30 (2006.01); G06F 13/40 (2006.01);
U.S. Cl.
CPC ...
G06F 13/385 (2013.01); G06F 11/3041 (2013.01); G06F 11/3048 (2013.01); G06F 11/3051 (2013.01); G06F 13/4068 (2013.01); G06F 13/4282 (2013.01);
Abstract

Methods, structures, and apparatus that limit the amount of dendritic growth and metal migration between contacts in order to prevent an erroneous detection of a connection and/or functional failure. One example may reduce dendritic growth and metal migration by limiting an amount of time that a connection detection voltage is applied to CC contacts of a USB Type-C connector when an electronic device is detecting a connection. This and other examples may further limit dendritic growth by not applying the connection detection voltage to the CC contacts for a first duration following a detection of a disconnection.


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