The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 30, 2018
Filed:
Apr. 10, 2014
Applicant:
Nec Laboratories America, Inc., Princeton, NJ (US);
Inventors:
Hui Zhang, Princeton Junction, NJ (US);
Nipun Arora, Plainsboro, NJ (US);
Junghwan Rhee, Princeton, NJ (US);
Kai Ma, Princeton, NJ (US);
Guofei Jiang, Princeton, NJ (US);
Assignee:
NEC Corporation, , JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3636 (2013.01);
Abstract
The invention is directed to a computer implemented method and a system that implements an application performance profiler with hardware performance event information. The profiler provides dynamic tracing of application programs, and offers fine-grained hardware performance event profiling at function levels. To control the perturbation on target applications, the profiler also includes a control mechanism to constraint the function profiling overhead within a budget configured by users.