The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 30, 2018
Filed:
May. 23, 2016
Baidu Usa Llc, Sunnyvale, CA (US);
Baida USA LLC, Sunnyvale, CA (US);
Abstract
A method for testing peripheral component interconnect express (PCIe) devices is provided. The method implemented at a PCIe testing system detects that one or more PCIe devices have been inserted into one or more PCIe buses of a data processing system. In response to the detection, the PCIe testing system scans all PCIe buses of the data processing system to discover the one or more PCIe devices. For each of the PCIe devices discovered, the PCIe testing system repairs and retrains a PCIe link associated with the PCIe device, without rebooting the data processing system. The PCIe testing system loads a device driver instance for the PCIe device to be hosted by an operating system. The PCIe testing system then executes a test routine to concurrently test the one or more PCIe devices via the respective device driver instances.