The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 30, 2018

Filed:

Mar. 09, 2016
Applicants:

Boe Technology Group Co., Ltd., Beijing, CN;

Beijing Boe Display Technology Co., Ltd., Beijing, CN;

Inventors:

Pengyu Qi, Beijing, CN;

Changjun Zha, Beijing, CN;

Yanping Wang, Beijing, CN;

Dong Wang, Beijing, CN;

Jianfeng Yuan, Beijing, CN;

Xibin Shao, Beijing, CN;

Yan Zhang, Beijing, CN;

Jintao Xiao, Beijing, CN;

Yangchen Guo, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 1/38 (2012.01); G03F 7/00 (2006.01); G03F 7/20 (2006.01); G03F 7/30 (2006.01); G02F 1/13 (2006.01);
U.S. Cl.
CPC ...
G03F 1/38 (2013.01); G03F 7/0007 (2013.01); G03F 7/20 (2013.01); G03F 7/30 (2013.01); G03F 7/70191 (2013.01); G02F 1/1303 (2013.01);
Abstract

The present disclosure provides a mask plate, an exposure device and an exposure method. The mask plate includes a base plate and a plurality of patterns with openings arranged on the base plate. The base plate includes a first region corresponding to a position where a developing agent has a low concentration in the case that a target substrate is to be developed, and a second region corresponding to a position where the developing agent has a high concentration in the case that the target substrate is to be developed. In the case that the target substrate is exposed using the mask plate, an amount of light beams passing through each pattern at the first region of the base plate is greater than an amount of the light beams passing through each pattern at the second region of the base plate.


Find Patent Forward Citations

Loading…