The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 30, 2018
Filed:
Dec. 03, 2014
Olympus Corporation, Shibuya-ku, Tokyo, JP;
Kosuke Takagi, Tokyo, JP;
OLYMPUS CORPORATION, Tokyo, JP;
Abstract
A plurality of specimens or a plurality of targets in a specimen are accurately examined. A microscope apparatus includes a light source; an image-generating unit generating an image of a specimen; a control unit controlling the light source and the image-generating unit depending on a predetermined irradiation condition or a predetermined image generation condition; an image-analyzing unit analyzing the image generated by the image-generating unit to extract targets; and a condition-changing unit changing the irradiation condition and/or the image generation condition based on a difference between an actual luminance of each of the extracted targets in the image and a desired luminance such that the actual luminance of the target in the image satisfies the desired luminance. If the irradiation condition and/or the image generation condition is changed, the control unit redrives the light source and the image-generating unit depending on the changed irradiation condition and/or image generation condition.