The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 30, 2018
Filed:
Jun. 24, 2013
Applicant:
Leica Geosystems Ag, Heerbrugg, CH;
Inventor:
Reto Stutz, Berneck, CH;
Assignee:
LEICA GEOSYSTEMS AG, Heerburg, CH;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 3/08 (2006.01); G01S 17/08 (2006.01); G01S 7/486 (2006.01); H03M 1/12 (2006.01);
U.S. Cl.
CPC ...
G01S 17/08 (2013.01); G01S 7/4861 (2013.01); H03M 1/1245 (2013.01);
Abstract
The invention relates to a distance measuring method comprising at least the step of emitting at least one measurement signal to a target object, in which at least one start signal is produced, and the measurement signal is back scattered from the target object as a target signal. Said target signal and optionally also the start signal is sampled in a first and a second sampling at various sampling rates and determines the distance to the target object from the relative position from the start signal and the target signal.