The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 30, 2018

Filed:

Apr. 07, 2016
Applicant:

Nec Laboratories America, Inc., Princeton, NJ (US);

Inventors:

Feng Guo, Sunnyvale, CA (US);

Ratnesh Sharma, Fremont, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2014.01); G01R 31/36 (2006.01); H02J 1/00 (2006.01); H02M 7/537 (2006.01); H02M 1/08 (2006.01); G06F 17/50 (2006.01); G06N 7/02 (2006.01); H02M 7/483 (2007.01); H02M 1/00 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3648 (2013.01); G01R 31/2601 (2013.01); G06F 17/5068 (2013.01); G06N 7/02 (2013.01); H02J 1/00 (2013.01); H02M 1/08 (2013.01); H02M 7/483 (2013.01); H02M 7/537 (2013.01); H02M 2001/0054 (2013.01); H02M 2007/4835 (2013.01); Y02B 70/1491 (2013.01);
Abstract

Systems and methods for semiconductor device selection, including identifying a worst operation condition for a plurality of semiconductor devices in a Modular Multilevel Converter (MMC). The identifying includes determining power losses for each of the semiconductor devices under a plurality of operation conditions, and calculating a maximum junction temperature for each of the plurality of semiconductor devices at each of the plurality of operation conditions. A maximum junction temperature under the identified worst operation condition is determined for each of a plurality of commercially available semiconductor devices which satisfy a threshold voltage rating, and all semiconductor devices which satisfy the threshold voltage rating and a maximum junction temperature threshold condition are compared to identify a semiconductor device with a lowest system cost.


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