The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 30, 2018
Filed:
Aug. 22, 2013
Altera Corporation, San Jose, CA (US);
Christopher Sun Young Chen, San Jose, CA (US);
Jeffrey T. Watt, Palo Alto, CA (US);
Altera Corporation, San Jose, CA (US);
Abstract
An integrated circuit capable of monitoring aging effects on an integrated circuit device is disclosed. The integrated circuit includes a control circuit that obtains a clock signal at different frequencies. A sense circuit may receive the clock signal. First and second control signals may be asserted on the integrated circuit with the control circuit. The first control signal may activate a stress mode, and the second control signal may activate a measurement mode. During stress mode, the sense circuit may receive the clock signal. Any changes in predetermined electrical parameters of one or more transistors in the sense circuit may be monitored and measured during the measurement mode. Aging compensation may be performed when aging effect is detected on the sense circuit.