The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 30, 2018
Filed:
Jan. 23, 2015
Nec Corporation, Tokyo, JP;
Eisuke Saneyoshi, Tokyo, JP;
Ryo Hashimoto, Tokyo, JP;
Kosuke Homma, Tokyo, JP;
Koji Kudo, Tokyo, JP;
Takahiro Toizumi, Tokyo, JP;
NEC Corporation, Tokyo, JP;
Abstract
A monitoring device () includes: a unit-specific waveform data acquisition unit () that acquires unit-specific monitoring waveform data which is waveform data of at least one among total current consumption, a total input voltage, and total power consumption in a unit in which monitoring target electrical devices are installed; a first inference unit () that infers operation states of at least some of the monitoring target electrical devices based on a 1st feature amount group including at least one kind of feature amount extracted from the unit-specific monitoring waveform data, and a training feature amount which is a feature amount of each of the monitoring target electrical devices in a predetermined operation state; and a second inference unit () that infers the operation states of some of the monitoring target electrical devices based on a 2nd feature amount group including at least one kind of feature amount extracted from the unit-specific monitoring waveform data, and different from the 1st feature amount group and the training feature amount.