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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10114042 B1

PDFFull Text
Date of Patent:
Oct. 30, 2018

Filed:

Feb. 05, 2016

Vertical probe card

Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Ming Fang, Plano, TX (US);

Faheem Mohamedi, Arlington, TX (US);

Assignee:

TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);

Attorneys:

Kenneth Liu

Charles A. Brill

Frank D. Cimino

Primary Examiner:

Vinh Nguyen

Int. Cl.
CPC ...
G01R 31/00 (2006.01); G01R 1/073 (2006.01); G01R 1/067 (2006.01);
U.S. Cl.
CPC ...
G01R 1/07314 (2013.01); G01R 1/06727 (2013.01); G01R 1/07364 (2013.01);
Abstract

A probe for a vertical probe card includes an unsupported base portion that extends from the vertical probe card, a cantilevered portion that extends substantially perpendicular to the unsupported base portion and a contact portion that includes a tip. The cantilevered portion has a first thickness at an end adjacent the unsupported base portion and a second thickness at an end adjacent the contact portion, the second thickness being less than the first thickness.

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Quick Actions:

Fang, Ming. (2018). Vertical probe card (U.S. Patent No. 10114042). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10114042

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