The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 30, 2018
Filed:
Sep. 23, 2015
Samsung Electronics Co., Ltd., Suwon-si, KR;
Yeong Bae Yeo, Seoul, KR;
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
Abstract
A test apparatus and a control method thereof are provided. The test apparatus is configured to test a sample in a reactor. The test apparatus includes at least one light emitter configured to emit light to chambers of the reactor, a light receiver configured to receive light passed through the chambers while scanning the chambers, and a processor configured to determine a position or an area of a chamber among the chambers, based on light receiving positions of the light receiver, and respective intensities of the received light. The processor is further configured to measure an optical density of light passed through the determined position or the determined area of the chamber.