The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 30, 2018

Filed:

Oct. 14, 2014
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Yeong-bae Yeo, Seoul, KR;

Hyun-soo Jang, Uiwang-si, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/59 (2006.01); G01N 21/75 (2006.01);
U.S. Cl.
CPC ...
G01N 21/59 (2013.01); G01N 21/75 (2013.01); G01N 2201/0612 (2013.01); G01N 2201/0621 (2013.01); G01N 2201/0696 (2013.01); G01N 2201/105 (2013.01); G01N 2201/121 (2013.01); G01N 2201/127 (2013.01);
Abstract

An optical detection apparatus for measuring detection chambers of a specimen cartridge includes: a light source unit including light sources which are arranged along a scan line on which the detection chambers are aligned to be scanned, and configured to emit light rays to the detection chambers; and an optical detector configured to detect the light rays having passed through corresponding detection chambers disposed on the scan line. The light sources include main wavelength light sources which are used for measuring samples disposed in the detection chambers, and a sub-wavelength light source which is used for correcting a measuring error.


Find Patent Forward Citations

Yeo, Yeong-bae. (2018). Optical detection apparatus and method of compensating detection error (U.S. Patent No. 10113964). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10113964

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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