The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 30, 2018

Filed:

May. 24, 2016
Applicant:

Ingrain, Inc., Houston, TX (US);

Inventor:

Kathryn Elizabeth Washburn, Houston, TX (US);

Assignee:

Ingrain, Inc., Houston, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/27 (2006.01); G01N 21/71 (2006.01); G01N 33/24 (2006.01); G01N 29/46 (2006.01); G01N 33/28 (2006.01); G01N 21/3563 (2014.01); G01N 29/12 (2006.01); G01N 29/24 (2006.01); G01N 30/88 (2006.01);
U.S. Cl.
CPC ...
G01N 21/272 (2013.01); G01N 21/3563 (2013.01); G01N 21/718 (2013.01); G01N 29/12 (2013.01); G01N 29/2418 (2013.01); G01N 29/46 (2013.01); G01N 33/24 (2013.01); G01N 33/28 (2013.01); G01N 2030/8854 (2013.01); G01N 2291/0226 (2013.01);
Abstract

A method for determining mineralogical or geochemistry of at least one geological sample with vibrational spectroscopy combined with laser-induced breakdown spectral measurements performed on the geological sample in a time variant manner with spectral acquisitions made after each of a plurality of measurement shots, spectral pre-processing performed as necessary, and subsequent analysis is applied to the collected data to determine at least one mineralogical or geochemistry parameter of the sample. The method can provide a rapid method to estimate mineralogy or geochemical parameters of a sample, which does not require sample preparation, and which can be non-destructive with respect to portions of the sample. A system for performing the method also is provided.


Find Patent Forward Citations

Loading…