The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 30, 2018

Filed:

May. 06, 2015
Applicant:

Areva NP, Courbevoie, FR;

Inventor:

Yannick Caulier, Chalon sur Saone, FR;

Assignee:

AREVA NP, Courbevoie, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G01B 11/30 (2006.01); G01B 11/25 (2006.01); G01B 11/06 (2006.01); G02B 7/36 (2006.01); G02B 15/12 (2006.01); G06T 7/521 (2017.01); G06T 7/571 (2017.01);
U.S. Cl.
CPC ...
G01B 11/303 (2013.01); G01B 11/0608 (2013.01); G01B 11/2531 (2013.01); G02B 7/36 (2013.01); G02B 15/12 (2013.01); G06T 7/521 (2017.01); G06T 7/571 (2017.01); G06T 2207/10016 (2013.01);
Abstract

A device and method for three-dimensional reconstruction of a scene by image analysis is provided. This device comprises an image acquisition device to capture images of the scene, an analysis device to calculate a three-dimensional reconstruction of the scene from at least one image of the scene taken by the image acquisition device, and a projection device to project a first light pattern and a second light pattern, which are complementary, on the examined scene, the first light pattern and the second light pattern being projected along separate projection axes forming a non-zero angle between them, so as to be superimposed while forming a uniform image with homogenous intensity in a projection plane.


Find Patent Forward Citations

Caulier, Yannick. (2018). Device and method for three-dimensional reconstruction of a scene by image analysis (U.S. Patent No. 10113867). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10113867

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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