The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 30, 2018
Filed:
Oct. 21, 2015
Lanzatech New Zealand Limited, Skokie, IL (US);
Bjorn Daniel Heijstra, Skokie, IL (US);
Sean Dennis Simpson, Skokie, IL (US);
Nicholas Bourdakos, Skokie, IL (US);
Jason Carl Bromley, Skokie, IL (US);
Kai-Ming Yap, Skokie, IL (US);
LANZATECH NEW ZEALAND LIMITED, Auckland, NZ;
Abstract
Apparatuses and associated methods are described for the efficient evaluation of C1-containing substrates, and especially for such evaluation conducted locally, or on-site, at a prospective facility for implementation of a biological conversion process for desired end product using a C1 carbon source. The exact composition of a given, industrial C1-containing substrate, as well as the range in composition fluctuations, are generally difficult to reproduce at a remote facility (e.g., a laboratory or a pilot-scale or demonstration-scale process), as required for the accurate prediction/modeling of commercial performance to justify large capital expenditures for commercial scale-up.