The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 30, 2018
Filed:
Jan. 20, 2016
General Electric Company, Schenectady, NY (US);
Donnell Eugene Crear, Simpsonville, SC (US);
David Edward Schick, Greenville, SC (US);
Archie Lee Swanner, Jr., Easley, SC (US);
General Electric Company, Schenectady, NY (US);
Abstract
Methods for aligning a pair of calibrated lasers of a laser additive manufacturing system in an overlap region in which the pair of calibrated lasers selectively operate are provided. Respective first and second plurality of layers of a test structure are formed in the overlap region of the pair of calibrated lasers solely using a first calibrated laser of the pair of calibrated lasers and then solely using a second calibrated laser of the pair of calibrated lasers. The test structure forming creates an outer surface of the test structure corresponding to the overlap region. A dimension(s) of an offset step(s) created between the first plurality of layers and the second plurality of lasers in the outer surface of the test structure is/are measured. The lasers are aligned by applying the dimension(s) of the offset step(s) as an alignment correction(s) to at least one of the pair of calibrated lasers.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile