The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 30, 2018

Filed:

Nov. 30, 2015
Applicant:

Roche Diabetes Care, Inc., Indianapolis, IN (US);

Inventors:

Guenther Schmelzeisen-Redeker, Lorsch, DE;

Arnulf Staib, Heppenheim, DE;

Hans-Martin Kloetzer, Weinheim, DE;

Assignee:

ROCHE DIABETES CARE, INC., Indianapolis, IN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/1495 (2006.01); A61B 5/1486 (2006.01); A61B 5/145 (2006.01); A61B 5/1468 (2006.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
A61B 5/1495 (2013.01); A61B 5/1468 (2013.01); A61B 5/1486 (2013.01); A61B 5/14532 (2013.01); A61B 5/7203 (2013.01); A61B 5/725 (2013.01); A61B 5/746 (2013.01);
Abstract

The invention relates to a method for detecting a malfunction of a sensor for measuring an analyte concentration in vivo, wherein a series of measurement signals is produced by means of the sensor, and a value of a noise parameter is continually determined from the measuring signals, the noise parameter indicating how severely the measurement is impaired by interference signals. According to the invention, continually determined values of the noise parameter are used to determine how quickly the noise parameter changes, and the rate of change of the noise parameter is evaluated to detect a malfunction.


Find Patent Forward Citations

Loading…