The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 23, 2018
Filed:
May. 02, 2012
Amith V. Chincholi, Sunnyvale, CA (US);
Joseph M. Murray, Schwenksville, PA (US);
Martino Freda, Laval, CA;
Alpaslan Demir, Melville, NY (US);
Amith V. Chincholi, Sunnyvale, CA (US);
Joseph M. Murray, Schwenksville, PA (US);
Martino Freda, Laval, CA;
Alpaslan Demir, Melville, NY (US);
InterDigital Patent Holdings, Inc., Wilmington, DE (US);
Abstract
Systems, methods, and instrumentalities are disclosed to schedule user equipment (UE) measurements. An HeNB may identify a first cluster of UEs and a second cluster of UEs. The HeNB may determine a measuring gap schedule relating to the first cluster of UEs and the second cluster of UEs. The measuring gap schedule may indicate a measurement time for each cluster. The measurement time may indicate that UEs in a cluster withhold a transmission during the measurement time. The UEs in the cluster may measure a spectrum (e.g., frequency, channel, etc.) associated with a supplementary cell during the measurement time. The HeNB may send the measuring gap schedule to the first cluster of UEs and the second cluster of U Es. The HeN B may receive spectrum measurements of the supplementary cell from the first cluster of UEs and the second cluster of UEs, e.g., in accordance with the measuring gap schedule.