The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 23, 2018
Filed:
Oct. 12, 2015
Dell Products, Lp, Round Rock, TX (US);
Timothy C. Shaw, Austin, TX (US);
Christopher A. Torres, San Marcos, TX (US);
Deeder M. Aurongzeb, Austin, TX (US);
Roman Joel Pacheco, Leander, TX (US);
Maxwell Andrews, San Francisco, CA (US);
Dell Products, LP, Round Rock, TX (US);
Abstract
A system for determining a loss of calibration in a multi-view stereo imaging system including executing instructions, via a processor, for a multi-view stereo imaging system to process a plural image frame recorded from a plurality of digital cameras of an information handling system and based on plural image calibration parameters and detecting a physical impact event, via a physical sensor, to an information handling system. The system and method execute instructions for a physical impact event detection system to determine, based on physical sensor feedback data, whether a threshold level of a physical impact event has been reached so as to affect calibration of the multi-view stereo imaging system. The detected physical impact event may be a mechanical impact event, a thermal impact event, a vibration mechanical impact event, or another physical impact event.