The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 23, 2018

Filed:

Dec. 18, 2015
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Ana P. Appel, Sao Paulo, BR;

Victor F. Cavalcante, Campinas, BR;

Luis G. Moyano, Rio de Janerio, BR;

Vagner F. de Santana, Sao Paulo, BR;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/173 (2006.01); H04L 12/26 (2006.01);
U.S. Cl.
CPC ...
H04L 43/067 (2013.01); H04L 43/045 (2013.01); H04L 43/12 (2013.01);
Abstract

A method and system for analyzing temporal data includes selecting a data source in which data from the source contains temporal attributes, obtaining temporal data of a first size from the selected data source and mapping the temporal data from the selected source in a temporal graph. The method and system selects a temporal attribute, generates a time decay function of the selected temporal attribute and selects a time window in the temporal graph defining a data set of a second size less than the first size based on the time decay function. The data set contains a set of predefined properties, each having a metric calculated from data within the time window. The method and system samples data from the data source based on the selected time window and generates a temporal graph of the metrics of the predefined properties of the sampled network data.


Find Patent Forward Citations

Loading…