The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 23, 2018
Filed:
Feb. 08, 2012
Applicant:
Ozgur Sinanoglu, Abu Dhabi, AE;
Inventor:
Ozgur Sinanoglu, Abu Dhabi, AE;
Assignee:
NEW YORK UNIVERSITY, New York, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); H03K 19/00 (2006.01);
U.S. Cl.
CPC ...
H03K 19/0008 (2013.01);
Abstract
Exemplary method, computer-accessible medium, and test configuration can be provided for testing at least one flip-flop. For example, the exemplary test configuration can include at least one scan-out channel having a plurality of regions and a plurality of compactors associated with the plurality of regions. Further, exemplary method, computer-accessible medium, and test configuration can be provided for testing at least on flip-flop that in which at least one scan-out channel having a plurality of regions, a plurality of compactors, and associating the plurality of compactors with the plurality of regions can be provided.