The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 23, 2018
Filed:
Aug. 24, 2017
Sii Semiconductor Corporation, Chiba-shi, Chiba, JP;
Tomoki Hikichi, Chiba, JP;
Minoru Ariyama, Chiba, JP;
Kozo Iijima, Chiba, JP;
Masashi Shiga, Chiba, JP;
ABLIC INC., Chiba, JP;
Abstract
Provided is a semiconductor device which is testable even with an inspection apparatus having low current drivability, and includes an output terminal which is also used as a test terminal and an output driver having high current drivability. The semiconductor device includes a plurality of voltage determination circuits connected to the output terminal of the semiconductor device, and have threshold values that are different from each other, an encoding circuit connected to the plurality of voltage determination circuits, and configured to output an encoded signal, and a mode switching circuit configured to output a mode signal to an internal circuit depending on the encoded signal and a signal from the internal circuit.