The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 23, 2018

Filed:

Feb. 13, 2015
Applicant:

The United States of America As Represented BY the Secretary of the Navy, Washington, DC (US);

Inventors:

Andrew Frink, Bloomington, IN (US);

George Whitaker, Albuquerque, NM (US);

Jeffrey Maas, Arlington, VA (US);

Kenneth W. O'Haver, Ellicott City, MD (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 17/12 (2015.01); H04B 17/21 (2015.01); H01Q 3/26 (2006.01);
U.S. Cl.
CPC ...
H01Q 3/267 (2013.01); H04B 17/12 (2015.01); H04B 17/21 (2015.01); Y10T 29/49005 (2015.01);
Abstract

A calibration method, applicable to element-level digital arrays operating in the receive mode, which utilizes the individual element plane wave spectra obtained from a single planar near-field scan. The method generates highly accurate near-field measurement derived amplitude and phase calibration of both large and small digital arrays as a function of array scan. The present disclosure provides digital array calibration methods and their potential uses in satellites and directional arrays.


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