The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 23, 2018
Filed:
Jan. 13, 2017
Sharper Shape Oy, Espoo, FI;
Tero Heinonen, Järvenpää, FI;
Sharper Shape Oy, Espoo, FI;
Abstract
A method and a system for inertial measurement. The method includes controlling at least one imaging sensor to capture at least two consecutive images, processing the at least two consecutive images to identify at least one feature therein and determining at least one parameter associated with the at least one feature, and determining a change in a position and an orientation of the at least one imaging sensor, based upon the at least one parameter associated with the at least one feature. The at least one parameter includes at least one of: a presence or absence of the at least one feature in at least one of the at least two consecutive images, respective pixel locations of the at least one feature in the at least two consecutive images, and/or three-dimensional locations of the at least one feature with respect to the at least one imaging sensor.